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FISCHER XAN 250

XAN 250 FISCHER Common Process for Testing DETAILS: Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement FEATURES Universal premium instrument with comprehensive measurement capabilitiesAperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeableWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning TYPICAL FIELDS OF APPLICATION Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industriesTrace analysis for consumer protection, e.g. lead content in toysAnalysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineriesResearch in universities and in the industries ..

XAN 250 FISCHER

Common Process for Testing

DETAILS:

Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement

FEATURES

  • Universal premium instrument with comprehensive measurement capabilities
  • Aperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeable
  • With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
  • Measuring direction from bottom to top, this allows for quick and easy sample positioning

TYPICAL FIELDS OF APPLICATION

  • Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
  • Trace analysis for consumer protection, e.g. lead content in toys
  • Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
  • Research in universities and in the industries